Figure 10.3 — Photonic force microscope with rotational force fields

Fig. 10.3 — Photonic force microscope with rotational force fields
Figure 10.3 — Photonic force microscope with rotational force fields. If a rotational force field is superimposed on the harmonic trapping potential generated by an optical tweezers, no shift of the optically trapped particle occurs. Therefore, more sophisticated statistical analysis techniques are necessary to detect the presence of the rotational force field than to detect the one presented in Fig. 10.2.