Philip H. Jones, Onofrio M. Maragò & Giovanni Volpe
Fig. 10.3 — Photonic force microscope with rotational force fields
If a rotational force field is superimposed on the harmonic trapping potential generated by an optical tweezers, no shift of the optically trapped particle occurs. Therefore, more sophisticated statistical analysis techniques are necessary to detect the presence of the rotational force field than to detect the one presented in Fig. 10.2.
Fig. 10.3 — Photonic force microscope with rotational force fields